Quote Originally Posted by Johnsonwaugh View Post
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and deliver images with information about the samples' topography and composition. CSEMs (conventional SEMs with a thermic electron source.

Scanning electron microscopy (SEM) is a method for high-resolution imaging of surfaces. An electron microscope in which a beam of focused electrons moves across the object with the secondary electrons. Instead of relying on a single detector, this device combines 3 different Micro-analytical detectors: SE, BSE and EDS.
You had me at hello...... also, smoothest resurrection of an 8 year old thread I've ever seen I take it this is something you are passionate about. Thank you for the information, very thorough